LaRGIS equipments for characterization and performance analysis techniques as Contact angle goniometer, X-ray photoelectron spectroscopy (XPS), AFM, SEM, Optical microscope, High speed camera, corrosion test set-up are as follow :
Contact angle goniometry
Contact angle and contact angle hysteresis measurement is performed using a Kruss™ DSA100 goniometer equipped with a video camera.
Atomic force microscopy (AFM)
Surface morphology is studied using a Digital Instruments multi-mode atomic force microscope with IIIa controller (Digital Instruments, USA)
X-Ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES)
A XPS/AES system jointly manufactured by Staib Instruments GmbH (Germany) and Plasmionique (Quebec, Canada) is used. This system is equipped with two different side chambers, which can be utilized to prepare the sample for further analysis. These two side chambers are equipped with a magnetron sputtering reactor, a plasma generator and an ion gun, which can be used to prepare the sample prior to transferring it to the main analysis chamber. The resulted spectra from XPS and AES are further analysed using CasaXPS, an analysis software developed by Casa Software Ltd. (UK)
In order to estimate the surface stability against natural factors, a simulated but accelerated natural condition should be provided. In order to do so, a QUV accelerated weathering tester manufactured by Q-LAB (USA) is used. This accelerated weathering tester is capable of UV exposure and water spray or condensation.
High speed camera
Photron SA 1.1 high speed camera capable of recording up to 600000 fps.
Nikon Polarizing Microscope (Nikon ECLIPSE E600Pol)
Electrochemical experiments are conducted by using a Biologic SP-300 under control of EC-Lab® software.